Patent · US Expired

Process for monitoring a device for automatically detecting and evaluating surface cracks

US5003831A · kind A · utility

3Cited by
0References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 29, 1989
Grant dateApr 2, 1991
Priority date
Expiry dateDec 29, 2009

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/102
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In a process for monitoring a device for automatically detecting and evaluating surface cracks by means of magnetic powder or the dye penetration process comprising an image pick-up camera and a digital image processing and control unit, a typical defect pattern is projected by means of a projector onto the surface of the article to be examined in the pick-up region of the image pick-up camera and registered, and a defect indication is triggered if the device ceases to operate reliably.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.