Process for monitoring a device for automatically detecting and evaluating surface cracks
US5003831A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 29, 1989 |
| Grant date | Apr 2, 1991 |
| Priority date | — |
| Expiry date | Dec 29, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/102
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a process for monitoring a device for automatically detecting and evaluating surface cracks by means of magnetic powder or the dye penetration process comprising an image pick-up camera and a digital image processing and control unit, a typical defect pattern is projected by means of a projector onto the surface of the article to be examined in the pick-up region of the image pick-up camera and registered, and a defect indication is triggered if the device ceases to operate reliably.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.