Differential phase contrast scanning transmission electron microscope
US5004918A · kind A · utility
30Cited by
6References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 24, 1990 |
| Grant date | Apr 2, 1991 |
| Priority date | — |
| Expiry date | Jan 24, 2010 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J37/2955
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A differential phase contrast scanning transmission electron microscope capable of obtaining a clear differential phase contrast image. This microscope includes a charge-coupled image sensor on which a diffraction image is projected. The region covered by the image sensor is divided into two parts by a straight line. The difference between the amounts of electrons impinging on these two parts is calculated, and the resulting differential signal is supplied to a display unit to display an image of the specimen.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.