Method for regenerating in-circuit test sequences for circuit board components
US5004978A · kind A · utility
13Cited by
3References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 29, 1990 |
| Grant date | Apr 2, 1991 |
| Priority date | — |
| Expiry date | Mar 29, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318307
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for use in an in-circuit tester automatically determines which test sequences must be regenerated as a result of a board modification, and automatically regenerates only the test sequences affected by the modification.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.