X-ray diffraction inspection system
US5007072A · kind A · utility
92Cited by
23References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 3, 1988 |
| Grant date | Apr 9, 1991 |
| Priority date | — |
| Expiry date | Aug 3, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection system for detecting the presence of selected crystalline materials, such as explosives or drugs, utilizing an x-ray source and a collimated array of detectors to sense radiation scattered by the objects being inspected. A signal processing system compares the measured signal with selected spectra to determine whether specific materials are present within the inspected object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.