Device and method for measuring the deformations of a sample
US5009512A · kind A · utility
33Cited by
9References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 9, 1990 |
| Grant date | Apr 23, 1991 |
| Priority date | — |
| Expiry date | May 9, 2010 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S33/19
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device and method for measuring the deformations of a sample, which deformations particularly result from the relaxation of the stresses to which the samples was previously subjected. The device and method include the use of a cell inside which the sample is placed with the cell containing a thermal mass whose heat capacity and/or thermal conductibility are appreciably greater than those of air under normal temperature and pressure conditions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.