Electron beam evaporation source
US5012064A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 1990 |
| Grant date | Apr 30, 1991 |
| Priority date | — |
| Expiry date | Jun 29, 2010 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J37/3053
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present invention provides an electron beam evaporation source designed so that the size of the impact area of the electron beam on an evaporant will remain essentially constant in any position of the impact area on the evaporant; and thus, the rate of evaporation will remain essentially constant. To this end, a quadrapole comprising a set of two pairs of electromagnets is used to deflect the electron beam. The quadrapoles provide a uniform magnetic deflection field to prevent distortion of the impact area. A pair of pole pieces, used in deflecting the electron beam through an arc of 270 degrees, are provided with a predetermined thickness and spacing to prevent lengthening of the impact area parallel to the pole pieces as the electron beam is deflected parallel to the pole pieces. The pole pieces, however, produce the formation of tail regions in the impact area when the impact area is positioned near the pole pieces. In order to eliminate such tail regions, a pair of surface dipoles are connected to the pole pieces at an angle of 45 degrees such that the electron beam passes between the ends of the dipoles at a near vertical location of the arc of the electron beam. The maint…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.