Device and method for measuring the deformations of a sample
US5014440A · kind A · utility
10Cited by
7References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 29, 1988 |
| Grant date | May 14, 1991 |
| Priority date | — |
| Expiry date | Jun 29, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device and method are provided for measuring the deformations of a sample, with the deformations resulting more particularly from the relaxation of the stresses to which the samples were subjected prior to the measurement, and with the sample having an axis corresponding to a main deformation direction. The device comprises at least five displacement sensors each having a measurement direction, with the measurement directions being substantially perpendicular to the axis of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.