Particle size measuring system
US5015094A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 28, 1989 |
| Grant date | May 14, 1991 |
| Priority date | — |
| Expiry date | Sep 28, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/0222
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is disclosed a system in which, according to the time domain method, a laser light is irradiated to an object to be measured, photon pulses based on the scattering light from the object to be measured are received, time series data are generated based on the light receiving signal, and based on the time series data thus generated, the particle size distribution of particles in the object to be measured is measured. Thus, the present invention achieves a considerable reduction in time required for finally obtaining the particle size based on the measured data, as compared with a conventional system using a calculator program.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.