Outer product optical interferometer with hologram
US5020018A · kind A · utility
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18References
2Claims
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Key dates
| Filing date | Mar 1, 1989 |
| Grant date | May 28, 1991 |
| Priority date | — |
| Expiry date | Mar 1, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06E3/003
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An outer product shearing interferometer for an optical source of one-dimensional extent which provides interference between every two points on the source. The interferometer comprises an input plane containing the source, an output plane for observing the outer product, a hologram which imparts the sum of two contributions whose phases are bilinear functions of the spatial coordinates, a two-dimensional Fourier transform system which illuminates the hologram with the transform of light from the input plane, and a one-dimensional Fourier transform system which takes light from the hologram and illuminates the output plane.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.