Patent · US Expired

Apparatus for the optical detection of flaws, in particular cracks in transparent objects

US5020908A · kind A · utility

23Cited by
3References
24Claims
0Family size

Inventor

Key dates

Filing dateMar 30, 1990
Grant dateJun 4, 1991
Priority date
Expiry dateMar 30, 2010

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/9054
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus for the optical detection of cracks in transparent objects having several radiation sources and several groups of detectors which each have eight detectors. Each radiation impulse from one or more radiation sources may impinge on one or more groups of detectors and form an electro-optical channel independent of the others. The channels are switched on and off periodically one after the other. The sensitivity level of each group of detectors is individually programmable. The groups of detectors and the radiation sources are mounted on a stand so that they may be adjusted having a frame with holders. Light scattering is minimized by fitting the groups of detectors with shields. Such an apparatus can be relatively simply set up and adjusted and be simplified as a result of the separation of the electro-optical channels. The electronic switching permits a rapid, safe and automatic detection of flaws when a suitable microprocessor is employed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.