Solder wave dwell timer
US5023848A · kind A · utility
14Cited by
4References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 15, 1989 |
| Grant date | Jun 11, 1991 |
| Priority date | — |
| Expiry date | May 15, 2009 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB23K1/085
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A pair of spaced apart probes generally approximating the contact geometry of conveyed object to be wave soldered is similarly conveyed past and in contact with the solder wave. A timing circuit interconnects with the probes and measures the dwell time of the pair of probes in contact with the solder wave. The probes may have different shaped solder wave contacting parts (e.g., linear edge, points).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.