Diagnostic locator for mechanically malfunctioning electronic circuitry
US5024095A · kind A · utility
Inventor
Key dates
| Filing date | Dec 5, 1989 |
| Grant date | Jun 18, 1991 |
| Priority date | — |
| Expiry date | Dec 5, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N3/34
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of diagnosis utilizing a diagnostic locator for detecting sources of electronic circuit malfunction caused by fractured solder connections or other kinetically locatable electronic circuit malfunctions comprises a diagnostic locator using kinetic energy at sonic frequencies which is discriminately applied to particular circuit areas to reveal mechanical intermittance on an accurate basis. The locator includes an elongated non-conductive test probe which is mounted within a housing at one end containing a transducer for kinetically activating the probe. An operator may adjust the kinetic energy being released at the probe tip for greater or lesser propagation upon electronic circuitry being diagnosed. This diagnosis of mechanically malfunctioning electronic circuitry is accomplished while monitoring the output of the circuitry in a conventional manner.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.