Patent · US Expired

Methods for making photodectors

US5026660A · kind A · utility

6Cited by
9References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 6, 1989
Grant dateJun 25, 1991
Priority date
Expiry dateSep 6, 2009

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/944

Abstract

A shadow-masking process for manufacturing low dark current photodetectors with low noise characteristics is disclosed. The process includes shadow-masking a semiconductor wafer by positioning a patterned shadow-mask on a surface of the wafer. The shadow-mask is patterned with, for example, circular openings or stripe openings. Layers, such as metallization layers to form metallic contacts or anti-reflection layers are deposited onto the wafer through the patterned openings in the shadow-masks. This shadow-masking process may be used in the production of any semiconductor device requiring patterned layers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.