Method for radiation detection and measurement
US5028794A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Nov 3, 1989 |
| Grant date | Jul 2, 1991 |
| Priority date | — |
| Expiry date | Nov 3, 2009 |
Classification
- Technology area (CPC —)General
Abstract
M-center luminescence is used to measure radiation. An LiF crystal is excited with a 442 nm He-Cd laser because absorption measurements in LiF indicate the peak of the M-center absorption occurs at 443 nm. Laser stimulation produces an excited state of the M-center, which undergoes a very strong Stokes' shift. The peak of the M-center emission spectrum occurs at 665 nm with a half-width of 0.36 ev. Since the excitation wavelength differs significantly from the emission wavelength, measurement of the deep red emission can be done simultaneously with the excitation. The population of M-centers grows with increasing radiation damage, and therefore M-center lunimescence provides a basis for radiation dosimetry.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.