Patent · US Expired

Solid state image sensing device

US5028972A · kind A · utility

17Cited by
4References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 1, 1988
Grant dateJul 2, 1991
Priority date
Expiry dateSep 1, 2008

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F39/153

Abstract

In a solid state image sensing device comprising: a semiconductor substrate; a photosensitive pixel area disposed on the semiconductor substrate for generating signal charges in response to incident light and storing the signal charges; a charge transfer area disposed adjacent to the photosensitive pixel area for transferring the signal charges stored in the photosensitive pixel area; and a transfer electrode provided above the charge transfer area, the solid state image sensing device comprises: a high melting temperature metal layer composed of molybdenum silicide MoSi formed above the transfer electrode and an insulating layer having ample thickness formed between the high melting temperature metal layer and the transfer electrode. The light shielding efficiency can be improved and occurrence of a smear phenomenon can be prevented in the resulting device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.