Patent · US Expired

Method and apparatus for classifying picture elements in radiation images

US5033100A · kind A · utility

8Cited by
5References
84Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 22, 1990
Grant dateJul 16, 1991
Priority date
Expiry dateJun 22, 2010

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30096
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Calculations are made to find the differences, .DELTA.ij=fij-f0, between the value of an image signal component f0 representing as picture element P0 in a radiation image and the values of image signal components fij representing the picture elements Pij, which are located on each of a plurality of lines Li, where i=1, 2, . . . , n, extending from the picture element P0 to the peripheral parts of the radiation image, and which are spaced a plurality of distances rij, where j=1, 2, . . . , m, from the picture element P0. A representative value, which is representative of the differences .DELTA.ij, is then found for each of the lines Li. A mean-level value of two representative values for each set of two lines, which extend from the picture element P0 in approximately opposite directions, is then calculated. From the mean-level values, which have been calculated for a plurality of the sets of lines, a judgment is made as to whether the picture element P0 falls or does not fall within the region corresponding to a circular pattern in the radiation image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.