Angular positioning and calibration of projected reference light planes
US5033847A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 9, 1990 |
| Grant date | Jul 23, 1991 |
| Priority date | — |
| Expiry date | Jan 9, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C15/004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A portion of first reference light plane is intercepted by a first one of a pair of angularly oriented reflective surfaces and reflected by the second of the pair of reflective surfaces as a second reference light plane at a selectable angle relative to the first reference light plane. The first and second reflective surfaces are movably mounted such that the first reflective surface can be rotated about a first axis coincident with or parallel to an incidence line in the first reflective surface which receives the first light plane and the second reflective surface can be rotated about a second axis parallel to but spaced from the first axis. The first and second reflective surfaces are mounted such that when the first reflective surface moves through an angle of a/2 degrees, the second reflective surface moves through an angle of a degrees. The first reflective surface is further mounted for rotation about a third axis coincident with or parallel to the first axis to vary the projection angle of the second reference light plane relative to the first reference light plane generator. Independent control of the rotational movement of the first reflective surface about the third axis…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.