Method of and apparatus for measuring the frequency response of an electrooptic device using an optical white noise generator
US5034678A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 14, 1989 |
| Grant date | Jul 23, 1991 |
| Priority date | — |
| Expiry date | Jul 14, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2603
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for measuring the frequency response of an electrooptic device, such as an optical detector, includes an optical amplifier for generating an optical white noise spectrum that is delivered to the detector. In a first embodiment, an optical amplifier or a luminescent fiber amplifier generates a white noise signal due to spontaneous-spontaneous beat noise emission, while a second embodiment utilizes the signal-spontaneous and spontaneous-spontaneous beat noise emissions generated by an optical amplifier driven by a laser source. The frequency response of the detector is determined from a measurement of the detected noise signal wherein any roll-off in the response must be due to the detector since the originally generated noise spectrum is flat.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.