Patent · US Expired

Method of making asymmetrical field effect transistor

US5036017A · kind A · utility

29Cited by
7References
16Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 27, 1989
Grant dateJul 30, 1991
Priority date
Expiry dateNov 27, 2009

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/85

Abstract

A method of making a field effect transistor includes forming an active layer in a semiconductor substrate, forming a gate material on a portion of the surface as an ion implantation mask, implanting dopant ions to form a source region, depositing a first mask over the source region and a portion of the gate material, and removing the unmasked gate material to define a gate electrode. A second mask is deposited adjacent the gate electrode opposite the source region, and dopant impurities are implanted to form a drain region using the mask. The source and drain regions are asymmetrically doped and the gate electrode is asymmetrically disposed relative to the source and drain regions in the self-aligning process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.