Apparatus and method for analysis using x-rays
US5040199A · kind A · utility
90Cited by
9References
40Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 7, 1989 |
| Grant date | Aug 13, 1991 |
| Priority date | — |
| Expiry date | Mar 7, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K1/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray analysis apparatus with an x-ray tube which generates an x-ray beam to expose an object to be analyzed. The apparatus inserts into and removes from the x-ray beam a piece of reference material such that regions of the object are exposed both to the x-ray beam and the x-ray beam obstructed by the reference material. A detector detects x-rays passing through the object and produces an indication of the object based upon the signals produced by the exposure to the x-ray beam and upon the signals produced by the exposure to the x-ray beam obstructed by the reference material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.