Electrooptic measurement systems for frequency analysis of very wide range signals
US5041778A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 17, 1989 |
| Grant date | Aug 20, 1991 |
| Priority date | — |
| Expiry date | Jul 17, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/17
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectrum analyzer for a variable amplitude and frequency electric signal includes an optical modulator responsive to the signal that derives a first optical wave having intensity and frequency components corresponding to the signal amplitude and frequency components. An optical analyzer responds to the first optical wave to derive a second optical wave having intensity variations at frequency components corresponding to the amplitude of the electric signal at the frequencies in the spectrum of the signal. The optical analyzer includes a tunable optical cavity responsive to the first optical wave to derive the second optical wave.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.