Scrap detector
US5042947A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 24, 1990 |
| Grant date | Aug 27, 1991 |
| Priority date | — |
| Expiry date | Sep 24, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/85
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a process and apparatus to analyze metal particles to determine their composition and to generate a sorting signal. The particles are exposed to a pulsed laser beam by which they are partly vaporized to form a plasma so that the particles are cleaned and the cleaned area is subsequently partially vaporized by a pulsed laser beam to form a plasma. The spectral lines of the plasma are inspected for an identification of the composition of the metal particles. The required inspection rate of 30 particles per second can readily be achieved or even exceeded if a defined narrow wavelength range or a defined wavelength is filtered from the total radiation that is emitted by the plasma and the intensities of the filtered partial radiations are related to each other to obtain ratios, which are compared with adjustable limiting values. A sorting signal is derived from the result of said comparison. The inspection rate can be improved in that the partial radiation is subjected to a comparison only for a defined interval of time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.