Method and apparatus for investigating materials with X-rays
US5044001A · kind A · utility
28Cited by
5References
26Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 20, 1990 |
| Grant date | Aug 27, 1991 |
| Priority date | — |
| Expiry date | Jun 20, 2010 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J35/116
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of investigating materials, especially biological specimens, utilizes a focused accelerated beam of electrons within an evacuated chamber, striking a metal foil within the chamber and exposing a specimen outside the evacuated chamber to x-rays generated in the metal foil. The apparatus of the invention functions as an x-ray microscope and in a preferred embodiment, as a scanning x-ray microscope.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.