Patent · US Expired

Monolithic temperature sensing device

US5049961A · kind A · utility

16Cited by
5References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 10, 1989
Grant dateSep 17, 1991
Priority date
Expiry dateJan 10, 2009

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/127

Abstract

A semiconductor diode monolithically integrated onto a power MOS transistor or power IGBT for temperature sensing. With the application of a positive bias and a constant current, the diode provides a voltage that varies linearly as a function of temperature for the power transistor. The diode is constructed in such a manner so as to prevent latch-up (i.e. where a parasite silicon controlled rectifiers is turned on, locking the power transistor in an on condition) and voltage breakdown (i.e. where the diode malfunctions from excessive voltage).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.