Patent · US Expired

Imaging system

US5051738A · kind A · utility

10Cited by
8References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 27, 1989
Grant dateSep 24, 1991
Priority date
Expiry dateFeb 27, 2009

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10H29/142

Abstract

A plurality of semi-conductor diodes disposed in an array may be constructed to emit light when subjected to a particular voltage. This voltage reversely biases the semi-conductor diodes to break down the semi-conductor diodes and to provide for the emission of light upon breakdown. The breakdown occurs at the junction between a pair of electrodes in each semi-conductor diode. One of the electrodes may be an n electrode and the other electrode may be a p electrode. To break down the diode, a positive voltage (e.g. 3-5 volts) may be applied to the n electrode and a ground voltage may be applied to the p electrode. The diodes are so small that an array of 1024.times.1024 diodes can be disposed in a space approximately 0.4" square to act as pixels. The diodes may be scanned, as in a raster scan, preferably on a repetitive basis. During such scan, individual ones of the diodes receive the breakdown voltage in representation of a visual image to provide a visual display of the image in the pixels defined by the diodes. The emitted light for each pixel is visible at the junction between the p electrode and the n electrode in the diode representing such pixel. The n electrode may be shape…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.