Patent · US Expired

Electro-optical ion detector for a scanning mass spectrometer and method of making same

US5053621A · kind A · utility

0Cited by
3References
6Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 19, 1990
Grant dateOct 1, 1991
Priority date
Expiry dateNov 19, 2010

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/06
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An improved electro-optical ion detector comprising a channel electron multiplier assembly located at the angled focal plane of the magnetic sector of a scanning mass spectrometer with a twisted fiberoptic window with a means for precisely optically coupling the assembly to the twisted fiberoptic window. Means are provided for precisely spacing the entrance end of said twisted fiberoptic window in the form of a foil of a selected thickness. Also disclosed is a method for making an improved electro-optical ion detector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.