Test device and method for testing electronic device and semiconductor device having the test device
US5053698A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 19, 1989 |
| Grant date | Oct 1, 1991 |
| Priority date | — |
| Expiry date | Oct 19, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31937
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test device for an electronic device includes a pattern generating circuit, a plurality of comparators and a memory. The pattern generating circuit generates at least one input pattern. The electronic device under test is supplied with the input pattern and generating a corresponding ouput signal. The comparators are connected to the electronic device under test and are supplied with the output signal therefrom. The comparators compare the output signal with an expected output signal with mutually different timing of comparison. The memory stores the comparison results supplied from the comparators. Characteristics of the electronic device under test are obtained from the comparison results stored in the memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.