Measuring circuit of the additive phase noise characteristic of a component in the vicinity of a carrier frequency
US5053714A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | May 21, 1990 |
| Grant date | Oct 1, 1991 |
| Priority date | — |
| Expiry date | May 21, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measuring circuit for the additive phase noise characteristic of a component in the vicinity of a carrier frequency. The measuring circuit is constructed of a central channel and two side channels. Each of these channels contains a model of the component to be characterized. Two phase detecting circuits are employed in which each processes an input signal from one of the side channels with an input signal from the central channel to generate signals which represent phase deviations between the two input signals. An intercorrelation circuit then utilizes the outputs from these phase detecting circuits to determine the characteristic additive phase noise of the component to be characterized by eliminating any additive phase noise superadded by other measuring circuit elements or induced by outside disturbances.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.