Bridgeless system for directly measuring complex impedance of an eddy current probe
US5055784A · kind A · utility
32Cited by
29References
24Claims
0Family size
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Key dates
| Filing date | Apr 5, 1990 |
| Grant date | Oct 8, 1991 |
| Priority date | — |
| Expiry date | Apr 5, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9046
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An all digital eddy current measurement system is described and illustrated in which an eddy current probe is driven by a driving signal and voltage signals representing the current through and voltage across the probe coil are used to calculate the magnitude and phase angle of a complex probe impedance. Digitization of the voltage signals is controlled by a control logic system which is run separately from but initiated by a microprocessor, the latter of which functions to analyze the acquired data and calculate impedance magnitude and phase angle values therefrom.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.