Method and apparatus for particle size analysis
US5056918A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 3, 1989 |
| Grant date | Oct 15, 1991 |
| Priority date | — |
| Expiry date | Mar 3, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0642
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus for measuring the intensity of light scattered by particles suspended in a sample volume illuminated by an interrogating light beam directed along an input axis, utilizing plural Fourier optical systems having lenses arranged for illuminating multiple photodetectors. The lenses of each Fourier optical system can be of different optical powers, for providing low power and high power optical trains. A low power optical train provides high resolution measurements of light scattered within a small angular range at low angles relative to the input axis, while a high power optical train provides lower resolution measurements of light scattered within a larger angular range at higher angles.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.