Patent · US Expired

Method for the determination of the element concentration in electron beam melting

US5057688A · kind A · utility

0Cited by

2References

3Claims

0Family size

Assignee

Bakish Materials Corporation · US

Inventors

Alexander von Ardenne · Dresden, DE
Eckehard Madler · Dresden, DE
Bernd Wehner · Dresden, DE
Kurt Richter · Richardson, US
Nicolas Schiller · Helmsdorf, DE
Josef Tobisch · Dresden, DE
Gunter Hahnel · Freital, DE

Key dates

Filing date	Aug 31, 1990
Grant date	Oct 15, 1991
Priority date	—
Expiry date	Aug 31, 2010

Classification

Technology area (CPC G)Physics
CPC primaryG01N23/2252
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for determining the element concentration in electron beam melting is used for the continous measurement during the melting process especially for melting alloys. According to the invention, the X-radiation generated during melting is utilized by concurrently measuring the intensity of the characteristic radiation of the element to be determined and the intensity of another portion of the X-ray spectrum from the same location of the melt. The quotient of both measurands then is a function of the concentration of the element to be determined.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.