Apparatus for measuring the quiescent current of an integrated monolithic digital circuit
US5057774A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 9, 1990 |
| Grant date | Oct 15, 1991 |
| Priority date | — |
| Expiry date | Jan 9, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R19/15
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An arrangement for measuring the quiescent current of a digital IC includes a current sensor connected in series with the IC and the voltage supply, a voltage stabilization circuit for stabilizing the voltage across the IC and a signal processing circuit coupled thereto for processing the measured quiescent current. The quiescent current is measured when no flip-flops are switched in the IC. By means of the arrangement, it is possible to measure rapidly and accurately whether the quiescent current assumes an abnormal value, which indicates that the IC contains defects. The signal processing circuit may include a current mirror which is coupled to a current comparator circuit supplying a digital output signal for determining the existence of a defect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.