Patent · US Expired

Ionization chamber dosimeter

US5061216A · kind A · utility

0Cited by
7References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 16, 1990
Grant dateOct 29, 1991
Priority date
Expiry dateApr 16, 2010

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J47/001
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method for fabricating an ion chamber dosimeter collecting array of the type utilizing plural discrete elements formed on a uniform collecting surface which includes forming a thin insulating layer over an aperture in a frame having surfaces, forming a predetermined pattern of through holes in the layer, plating both surfaces of the layer and simultaneously tilting and rotating the frame for uniform plate-through of the holes between surfaces. Aligned masking and patterned etching of the surfaces provides interconnects between the through holes and copper leads provided to external circuitry.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.