Integrated semiconductor circuit for thermal measurements
US5064296A · kind A · utility
24Cited by
11References
2Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 22, 1990 |
| Grant date | Nov 12, 1991 |
| Priority date | — |
| Expiry date | Jun 22, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K17/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Integrated semiconductor circuit for thermal measurements, comprising at least a thermal signal comparator (8), the comparator (8) being provided with a signal feedback loop containing a DA signal converter (3), more specifically, the comparator (8) being a temperature or a heat current comparator, the DA signal-converter (3) comprising a thermal output and the signal feedback loop comprising components for the transfer of thermal signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.