Patent · US Expired

Method of fabricating integrated silicon and non-silicon semiconductor devices

US5064781A · kind A · utility

22Cited by
4References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 31, 1990
Grant dateNov 12, 1991
Priority date
Expiry dateAug 31, 2010

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/08
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Silicon and non-silicon semiconductor devices are fabricated on a single chip by bonding a silicon wafer to a non-silicon semiconductor substate. Portions of the non-silicon semiconductor substrate are selectively etched to expose the silicon wafer. Semiconductor devices may then be formed in the silicon wafer and on the non-silicon semiconductor substrate. Alternatively, selective epitaxial silicon may be grown where the non-silicon semiconductor substrate was removed. In another embodiment, a non-silicon semiconductor substrate having wells formed therein is bonded to a silicon wafer. The non-silicon semiconductor substrate is then polished until openings are provided to the silicon wafer. Further processing is carried out as described above.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.