Apparatus and method for analyzing dielectric properties using a single surface electrode and force monitoring and adjusting
US5065106A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 25, 1991 |
| Grant date | Nov 12, 1991 |
| Priority date | — |
| Expiry date | Feb 25, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/2605
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A parallel plate or single surface dielectric analyzer is disclosed including: a distance sensor for accurately measuring the varying distance between the electrodes, such as a linear voltage differential transformer (LVDT), and apparatus responsive to the distance sensor for positioning the electrodes; a force transducer for measuring the applied force on the sample and apparatus responsive to the force transducer to give a desired force by varying the electrode spacing; disposable electrodes made using thick film technology composed of a ceramic substrate with a conductor adhered to its surface; and a temperature sensor built into one of the electrodes such as a platinum ring adhered to the surface of one of the electrodes and apparatus to measure the resistance across the platinum ring.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.