Probing device for a coordinate measuring apparatus
US5065526A · kind A · utility
8Cited by
3References
2Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 18, 1991 |
| Grant date | Nov 19, 1991 |
| Priority date | — |
| Expiry date | Mar 18, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/0014
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention is directed to an optoelectronic probing device for a coordinate measuring apparatus. The probe is exchangeable automatically via a probe changing device. The probing device has a temperature sensor which is in thermal contact with the material of the probing device. The connecting terminals of the sensor are applied to contacts on the exchange face of the probing device. In this way, it is possible to immediately determine the position of the optoelectronic components of the probe from the calibration data obtained at other temperatures after each probe exchange.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.