Testing device for both-sided two-stage contacting of equipped printed circuit boards

US5068600A · kind A · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Wolfgang Hilz · Munich, DE
• Rudolf Schuster · Heimstetten, DE
• Hans Schauflinger · Munich, DE

Key dates

• Filing date: May 23, 1990
• Grant date: Nov 26, 1991
• Expiry date: May 23, 2010

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R1/07335
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A testing device for both-sided two-stage contacting of equipped printed circuit boards. A lower needle adaptor has first and second resilient or spring-seated contact needles of different lengths and an upper needle adaptor has third and fourth resilient or spring-seated contact needles also differing in length, which are provided for both-sided, two-stage contacting of component equipped printed circuit boards. In all stages of the contacting, the printed circuit boards are firmly clamped between lower and upper pressure rams arranged test-specimen-associated. The testing device provides a high contacting reliability.