Method and apparatus for testing logic circuitry by applying a logical test pattern
US5072178A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 4, 1990 |
| Grant date | Dec 10, 1991 |
| Priority date | — |
| Expiry date | Jun 4, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/865
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing method of a logic circuit which can change test data in a testing apparatus and an apparatus which is used for the testing method are disclosed. The logic circuit testing apparatus having a first storage to store test data including a plurality of test patterns and a second storage to store each of the test patterns in correspondence to a group of tester pins further has a transfer circuit including a data converter to change the test patterns from the first storage and a third storage to store control data to control the data converter. The transfer circuit transfers each of the test patterns from the first storage to the second storage. When the test pattern is transferred by the transfer circuit, the test pattern is changed by the data converter by the control data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.