Patent · US Expired

Sample moving apparatus, sample moving system and semiconductor manufacturing apparatus

US5073912A · kind A · utility

57Cited by
7References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 14, 1989
Grant dateDec 17, 1991
Priority date
Expiry dateNov 14, 2009

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S414/136
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A sample moving apparatus for positioning wafers with high accuracy, which apparatus comprises a fine adjustment actuator having a drive stroke to finely move the wafer, a fine adjustment stage driven by the fine adjustment actuator, a coarse adjustment actuator having a drive stroke to relatively coarsely move the wafer, a coarse adjustment stage driven by the coarse adjustment actuator, and a holder arrangement for attractively holding the wafer onto the wafer bearing surfaces of the respective stages. Upon selective energization of the holder arrangement of the respective stages, the wafer is moved while being attracted to the coarse adjustment stage or while being attracted to the coarse adjustment stage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.