Pattern recognition device
US5073952A · kind A · utility
13Cited by
4References
4Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Sep 7, 1988 |
| Grant date | Dec 17, 1991 |
| Priority date | — |
| Expiry date | Sep 7, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30141
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Data which represents a border line of a region of a video image to be observed and which contains a large luminance difference compared with that of a defect to be detected is excluded in judgement when it belongs to a predetermined region so that it is possible to detect a minute defect or defects reliably even when a position of a workpiece is displaced from that of a master or when the border line of the workpiece is not coincident with that of the master due to a difference in size therebetween.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.