Mass spectrometer
US5077470A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 11, 1991 |
| Grant date | Dec 31, 1991 |
| Priority date | — |
| Expiry date | Jan 11, 2011 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/04
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method of mass spectrometry comprises the steps of ionizing the mixture of the sample and the matrix by repeated irradiation with primary particle beam pulses; introducing the produced ions into a mass analyzer and separating the ions with the mass analyzer according to their mass/charge ratios; detecting signals indicative of the number of the separated ions with an array detector; and integrating the detected signals during data collection periods in synchrony with the irradiation pulses of the primary particle beam. The data collection periods have a predetermined duration and predetermined start times relative to the primary particle beam pulses.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.