Patent · US Expired

Method of scanning an X-ray image by means of electrometer probes, and device for performing the method

US5077765A · kind A · utility

5Cited by

1References

7Claims

0Family size

Assignee

U.S. Philips Corporation · US

Inventors

Walter Hillen · Besigheim, DE
Stephan Rupp · Forchheim, DE
Ulrich Schiebel · Aachen, DE

Key dates

Filing date	Nov 14, 1990
Grant date	Dec 31, 1991
Priority date	—
Expiry date	Nov 14, 2010

Classification

Technology area (CPC G)Physics
CPC primaryG01T1/2964
WIPO fieldEnvironmental technology
WIPO sectorChemistry

Abstract

A plurality of electrometer probes (3, 4, 5, 6) scan charge patterns of a photoconductor (1) which is locally uniformly charged prior to the X-ray exposure and is discharged by the exposure in dependence on the intensity of the X-rays. The surface of the photoconductor is scanned after the exposure in order to determine the charge density, the electrometer probes (3, 4, 5, 6) forming for each pixel a pixel value which corresponds to the discharge at the relevant pixel to compensate for sensitivity fluctuations of the electrometer probes included is a calibration operation for the sensitivity of all electrometer probes in that two probes (3, 4, 5, 6) scan an identical section (a.sub.1 . . . d.sub.3) of the image, their relative sensitivity used for correcting the pixel values is derived from comparison of the resultant output signals of the probes (3, 4, 5, 6).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.