Determining the existence of misorientation in a crystal
US5077767A · kind A · utility
7Cited by
3References
18Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 14, 1991 |
| Grant date | Dec 31, 1991 |
| Priority date | — |
| Expiry date | Feb 14, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/205
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for determining the existence of misorientation in a crystal, comprising irradiating the crystal with X-rays pre-orientating any crystallographic plane of the crystal with respect to the axis of the X-rays, imaging X-rays received from the crystal so as to cause a plurality of effectively angularly-separated images to be formed, the energy of the X-rays being such that while carrying out the method at least some of the X-rays forming the images have intersected the whole depth of the portion of the crystal being examined, and determining the existence of any misorientation from the images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.