Technique for the analysis of insulating materials by glow discharge mass spectrometry
US5081352A · kind A · utility
0Cited by
2References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 14, 1991 |
| Grant date | Jan 14, 1992 |
| Priority date | — |
| Expiry date | Feb 14, 2011 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/142
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention describes a technique for sample preparation and analysis of ceramics and oxides. The technique involves mixing the ceramic or oxide powder with a conducting powder such as gallium, indium or silver and adding a small amount of dopant. The dopant comprises approximately 5-30% by weight of the sample and is selected from the group comprising thoria, yttria or ytterbia. It is theorized that the addition of the dopant provides a source of electrons that stabilizes the plasma in the glow discharge mass spectrometer which allows for impurity analysis in the part-per-million range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.