Arrangement of probes

US5082367A · kind A · utility

Assignee

• Pfaudler-Werke GmbH · DE

Inventors

• Werner Kohler
• Dieter Reinhardt · Erlangen, DE
• Hermann Gramlich · Wertheim, DE
• Reinhart Schertz · Oftersheim, DE
• Karl Weissmann · Bocholt, DE
• Rainer Trampert · Oftersheim, DE

Key dates

• Filing date: May 26, 1989
• Grant date: Jan 21, 1992
• Expiry date: May 26, 2009

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N21/8507
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An arrangement of probes is described, which comprises a carrier formed as an intermediate flange, in which a plurality of radially extending mounting openings are provided. The inner surfaces of the carrier are provided with an electrically insulating corrosion resistant layer, which is preferably an enamel layer. The carrier is having a polygonal outline and plane mounting surfaces surrounding the mounting openings. Measuring probes provided with a mounting flange can be exchangeably and sealingly attached to the mounting surfaces. By arranging different probes a large number of different measurement functions and supervision functions can be achieved. As an example, carrier sleeves comprising a window can be built in, so that a visual observation or a turbidity measurement can be performed.