Multi-point probe assembly for testing electronic device
US5084672A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 20, 1990 |
| Grant date | Jan 28, 1992 |
| Priority date | — |
| Expiry date | Feb 20, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K2215/0071
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A plurality of probe wires are held by a probe supporter having a substantially rectangular cross-section. First, second and third side walls of the supporter, support the probe wires in a manner wherein they are arranged at predetermined intervals in an essentially parallel relationship with each other. The probe wires respectively extend from the first side wall to the second side wall by way of the third side wall. When testing an electronic-device, the third side wall faces a main surface of the device. The third side wall has a groove extending in a direction parallel with the main surface of at least one of the first and second sides wall. Each of the probe wires crosses the groove in a direction perpendicular to the direction along which the groove extends. The portions of the wires which cross the groove are pressed against the tested terminals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.