Spectroanalytical systems
US5088823A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 29, 1989 |
| Grant date | Feb 18, 1992 |
| Priority date | — |
| Expiry date | Sep 29, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/73
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectroanalytical system includes entrance aperture defining structure for receiving radiation to be analyzed along a first path; collimating structure in the first path for providing collimated radiation along a second path; fixed refraction structure in the second path for spatially separating (refracting) radiation in the second path in a first direction as a function of wavelength; fixed echelle grating structure in the second path for spatially separating the refracted radiation as a function of wavelength in a second direction orthogonal to the first direction and directing the orthogonally dispersed radiation in a beam along a third path that does not pass through the first refraction structure; and two-dimensional array detector structure for detecting the beam of orthogonally refracted radiation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.