Apparatus for infrared imaging inspections
US5089700A · kind A · utility
10Cited by
1References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 30, 1990 |
| Grant date | Feb 18, 1992 |
| Priority date | — |
| Expiry date | Jan 30, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/72
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of nondestructively identifying regions "R" of high density in a substrate (10) of a bonded matrix of carbon fibers by resistively heating the substrate and taking an infrared image of the heated substrate. Terminals 12, 14, 16 and 18 are connected to a power supply 26 by wires 22 and cable 24 of which they are a part, to effect the heating.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.