Patent · US Expired

Method of forming a thin copper film by low temperture CVD

US5091209A · kind A · utility

17Cited by
4References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 11, 1990
Grant dateFeb 25, 1992
Priority date
Expiry dateOct 11, 2010

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C16/452
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A thin copper film is formed by CVD, by (a) forming a gas stream containing a copper halide, followed by introducing said gas stream into a CVD reaction chamber having a heated catalytic metal filament arranged herein, (b) introducing hydrogen gas into the CVD reaction chamber for activation of said hydrogen gas by the heated catalytic metal filament, and (c) carrying out the reaction between the copper halide contained in the gas stream introduced in step (a) and the hydrogen activated in step (b) near the surface of a substrate arranged within the CVD reaction chamber so as to deposit a thin copper film of copper on the substrate surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.